Get back to the Help Center User guide Feb. 2022

The Argo-SIM (Structured Illumination Microscopy) is specifically designed to assess and monitor the performance of fluorescence imaging systems based on structured illumination, and/or deconvolution algorithms: interference-based SIM (for example 2D SIM and 3D SIM), single point-scanning SIM (for example Re-scan and Airyscan) and multi-point scanning SIM (for example instant SIM, or iSIM). The Argo-SIM is compatible with typical system magnifications of 40×-100×. It contains the third generation of Argoglass®.

The Argo-SIM is not compatible with imaging modalities based on total internal reflection (TIRF), fluorophore localization (PALM, STORM, DNA-PAINT) and stimulated emission by depletion (STED).

This product is composed of:

The piece of Argoglass® consists of a special glass substrate with different fluorescent patterns embedded inside. The Argo-SIM is designed to quality-control many aspects of a structured illumination fluorescence imaging system, such as: field uniformity, field distortion, lateral co-registration accuracy, lateral resolution, intensity response, stage drift during Z-stacking, etc.

The Daybook software has two modules:

The best of Argolight technology, adapted into a microscope slide format, combined with the Daybook software, opens the path to easy, yet reliable and complete, quality control of structured illumination fluorescence imaging systems.

I. First use

1. Parcel verification

2. Quick start procedure

II. General handling and care

1. Handling and storage

2. Cleaning