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The Argo-SIM (Structured Illumination Microscopy) is specifically designed to assess and monitor the performance of fluorescence imaging systems based on structured illumination, and/or deconvolution algorithms: interference-based SIM (for example 2D SIM and 3D SIM), single point-scanning SIM (for example Re-scan and Airyscan) and multi-point scanning SIM (for example instant SIM, or iSIM). The Argo-SIM is compatible with typical system magnifications of 40×-100×. It contains the third generation of Argoglass®.
The Argo-SIM is not compatible with imaging modalities based on total internal reflection (TIRF), fluorophore localization (PALM, STORM, DNA-PAINT) and stimulated emission by depletion (STED).
This product is composed of:
The piece of Argoglass® consists of a special glass substrate with different fluorescent patterns embedded inside. The Argo-SIM is designed to quality-control many aspects of a structured illumination fluorescence imaging system, such as: field uniformity, field distortion, lateral co-registration accuracy, lateral resolution, intensity response, stage drift during Z-stacking, etc.
The Daybook software has two modules:
The best of Argolight technology, adapted into a microscope slide format, combined with the Daybook software, opens the path to easy, yet reliable and complete, quality control of structured illumination fluorescence imaging systems.